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Process Variability Impact on the SET Response of FinFET Multi-level Design27th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2019, Cusco, Peru. pp.89-113, ⟨10.1007/978-3-030-53273-4_5⟩
Conference papers
hal-03476601v1
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