@inproceedings{brendler:hal-03476601,
  TITLE = {{Process Variability Impact on the SET Response of FinFET Multi-level Design}},
  AUTHOR = {Brendler, Leonardo H. and Zimpeck, Alexandra L. and Meinhardt, Cristina and Reis, Ricardo},
  URL = {https://inria.hal.science/hal-03476601},
  BOOKTITLE = {{27th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC)}},
  ADDRESS = {Cusco, Peru},
  EDITOR = {Carolina Metzler and Pierre-Emmanuel Gaillardon and Giovanni De Micheli and Carlos Silva-Cardenas and Ricardo Reis},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {VLSI-SoC: New Technology Enabler},
  VOLUME = {AICT-586},
  PAGES = {89-113},
  YEAR = {2019},
  MONTH = Oct,
  DOI = {10.1007/978-3-030-53273-4\_5},
  KEYWORDS = {FinFET technology ; Multi-level design ; Process variability ; Soft errors ; Single Event Transient},
  PDF = {https://inria.hal.science/hal-03476601/file/501403_1_En_5_Chapter.pdf},
  HAL_ID = {hal-03476601},
  HAL_VERSION = {v1},
}