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On the Functional Test of Branch Prediction Units Based on the Branch History Table Architecture

Ernesto Sanchez , Matteo Sonza Reorda , Alberto Tonda
19th International Conference on Very Large Scale Integration (VLSISOC), Oct 2011, Hong Kong, China. pp.110-123, ⟨10.1007/978-3-642-32770-4_7⟩
Conference papers hal-01365976v1
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Improved Test Solutions for COTS-Based Systems in Space Applications

Riccardo Cantoro , Sara Carbonara , Andrea Florida , Ernesto Sanchez , Matteo Sonza Reorda , et al.
26th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2018, Verona, Italy. pp.187-206, ⟨10.1007/978-3-030-23425-6_10⟩
Conference papers hal-02321761v1
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Modular Functional Testing: Targeting the Small Embedded Memories in GPUs

Matteo Sonza Reorda , Josie Condia
28th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2020, Salt Lake City, UT, United States. pp.205-233, ⟨10.1007/978-3-030-81641-4_10⟩
Conference papers hal-03759725v1
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Partition-Based Faults Diagnosis of a VLIW Processor

Davide Sabena , Matteo Sonza Reorda , Luca Sterpone
21th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2013, Istanbul, Turkey. pp.208-226, ⟨10.1007/978-3-319-23799-2_10⟩
Conference papers hal-01380307v1

VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things

Michail Maniatakos , Ibrahim (abe) M. Elfadel , Matteo Sonza Reorda , H. Fatih Ugurdag , José Monteiro , et al.
Springer International Publishing, AICT-500, 2019, IFIP Advances in Information and Communication Technology, 978-3-030-15662-6. ⟨10.1007/978-3-030-15663-3⟩
Books hal-02319793v1
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Software-Based Self-Test for Delay Faults

Michelangelo Grosso , Matteo Sonza Reorda , Salvatore Rinaudo
27th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2019, Cusco, Peru. pp.1-19, ⟨10.1007/978-3-030-53273-4_1⟩
Conference papers hal-03476600v1
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On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors

Davide Sabena , Luca Sterpone , Matteo Sonza Reorda
20th International Conference on Very Large Scale Integration (VLSI-SoC), Aug 2012, Santa Cruz, CA, United States. pp.162-180, ⟨10.1007/978-3-642-45073-0_9⟩
Conference papers hal-01456968v1