Search - IFIP Open Digital Library

7 results

hal_authIdPerson_i : 990392

	For these 7 documents Send to ORCID RSS ATOM Export BibTeX XML-TEI CSV RTF EndNote PDF HTML Advanced export	Page :	sorted by Relevance Author A→Z Author Z→A Title A→Z Title Z→A Increasing publication date Decreasing publication date Increasing deposit date Decreasing deposit date

		Modular Functional Testing: Targeting the Small Embedded Memories in GPUs Matteo Sonza Reorda , Josie Condia 28th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2020, Salt Lake City, UT, United States. pp.205-233, ⟨10.1007/978-3-030-81641-4_10⟩ Conference papers hal-03759725v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More
		Partition-Based Faults Diagnosis of a VLIW Processor Davide Sabena , Matteo Sonza Reorda , Luca Sterpone 21th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2013, Istanbul, Turkey. pp.208-226, ⟨10.1007/978-3-319-23799-2_10⟩ Conference papers hal-01380307v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More
		Improved Test Solutions for COTS-Based Systems in Space Applications Riccardo Cantoro , Sara Carbonara , Andrea Florida , Ernesto Sanchez , Matteo Sonza Reorda , et al. 26th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2018, Verona, Italy. pp.187-206, ⟨10.1007/978-3-030-23425-6_10⟩ Conference papers hal-02321761v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More
		VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things Michail Maniatakos , Ibrahim (abe) M. Elfadel , Matteo Sonza Reorda , H. Fatih Ugurdag , José Monteiro , et al. Springer International Publishing, AICT-500, 2019, IFIP Advances in Information and Communication Technology, 978-3-030-15662-6. ⟨10.1007/978-3-030-15663-3⟩ Books hal-02319793v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More
		Software-Based Self-Test for Delay Faults Michelangelo Grosso , Matteo Sonza Reorda , Salvatore Rinaudo 27th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2019, Cusco, Peru. pp.1-19, ⟨10.1007/978-3-030-53273-4_1⟩ Conference papers hal-03476600v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More
		On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors Davide Sabena , Luca Sterpone , Matteo Sonza Reorda 20th International Conference on Very Large Scale Integration (VLSI-SoC), Aug 2012, Santa Cruz, CA, United States. pp.162-180, ⟨10.1007/978-3-642-45073-0_9⟩ Conference papers hal-01456968v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More
		On the Functional Test of Branch Prediction Units Based on the Branch History Table Architecture Ernesto Sanchez , Matteo Sonza Reorda , Alberto Tonda 19th International Conference on Very Large Scale Integration (VLSISOC), Oct 2011, Hong Kong, China. pp.110-123, ⟨10.1007/978-3-642-32770-4_7⟩ Conference papers hal-01365976v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More