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Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs25th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2017, Abu Dhabi, United Arab Emirates. pp.22-45, ⟨10.1007/978-3-030-15663-3_2⟩
Conference papers
hal-02319796v1
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