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Structure: Internal structure identifier : 303510
publicationDateY_i : 2022
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A DfT Strategy for Detecting Emerging Faults in RRAMs

Thiago Santos Copetti , Tobias Gemmeke , Leticia Poehls
29th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2021, Singapore, Singapore. pp.93-111, ⟨10.1007/978-3-031-16818-5_5⟩
Conference papers hal-04419565v1