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		Improved Fault Analysis of Signature Schemes Christophe Giraud , Erik W. Knudsen , Michael Tunstall 9th IFIP WG 8.8/11.2 International Conference on Smart Card Research and Advanced Applications (CARDIS), Apr 2010, Passau, Germany. pp.164-181, ⟨10.1007/978-3-642-12510-2_12⟩ Conference papers hal-01056107v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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