%0 Conference Proceedings
%T Improved Fault Analysis of Signature Schemes
%+ Oberthur Technologies
%+ Alm. Brand
%+ Department of Computer Science
%A Giraud, Christophe
%A Knudsen, Erik W.
%A Tunstall, Michael
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 9th IFIP WG 8.8/11.2 International Conference on Smart Card Research and Advanced Applications (CARDIS)
%C Passau, Germany
%Y Dieter Gollmann; Jean-Louis Lanet; Julien Iguchi-Cartigny
%I Springer
%3 Smart Card Research and Advanced Application
%V LNCS-6035
%P 164-181
%8 2010-04-14
%D 2010
%R 10.1007/978-3-642-12510-2_12
%K Fault analysis
%K Signature schemes
%K Smart card
%Z Computer Science [cs]/Digital Libraries [cs.DL]Conference papers
%X At ACISP 2004, Giraud and Knudsen presented the first fault analysis of DSA, ECDSA, XTR-DSA, Schnorr and ElGamal signatures schemes that considered faults affecting one byte. They showed that 2304 faulty signatures would be expected to reduce the number of possible keys to 240, allowing a 160-bit private key to be recovered. In this paper we show that Giraud and Knudsen's fault attack is much more efficient than originally claimed. We prove that 34.3% less faulty signatures are required to recover a private key using the same fault model. We also show that their original way of expressing the fault model under a system of equations can be improved. A more precise expression allows us to obtain another improvement of up to 47.1%, depending on the values of the key byte affected.
%G English
%2 https://inria.hal.science/hal-01056107/document
%2 https://inria.hal.science/hal-01056107/file/FAonSS.pdf
%L hal-01056107
%U https://inria.hal.science/hal-01056107
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-LNCS-6035
%~ IFIP-TC
%~ IFIP-TC11
%~ IFIP-TC8
%~ IFIP-WG11-2
%~ IFIP-2010
%~ IFIP-CARDIS
%~ IFIP-WG8-8