@inproceedings{giraud:hal-01056107,
  TITLE = {{Improved Fault Analysis of Signature Schemes}},
  AUTHOR = {Giraud, Christophe and Knudsen, Erik W. and Tunstall, Michael},
  URL = {https://inria.hal.science/hal-01056107},
  BOOKTITLE = {{9th IFIP WG 8.8/11.2 International Conference on Smart Card Research and Advanced Applications (CARDIS)}},
  ADDRESS = {Passau, Germany},
  EDITOR = {Dieter Gollmann; Jean-Louis Lanet; Julien Iguchi-Cartigny},
  PUBLISHER = {{Springer}},
  SERIES = {Smart Card Research and Advanced Application},
  VOLUME = {LNCS-6035},
  PAGES = {164-181},
  YEAR = {2010},
  MONTH = Apr,
  DOI = {10.1007/978-3-642-12510-2\_12},
  KEYWORDS = {Fault analysis ; Signature schemes ; Smart card},
  PDF = {https://inria.hal.science/hal-01056107/file/FAonSS.pdf},
  HAL_ID = {hal-01056107},
  HAL_VERSION = {v1},
}