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Deposit type : Fulltext
labStructName_s : Alm. Brand
labStructName_s : Department of Integrated Electronics, Shenzhen Institute of Advanced Technology
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Evaluation Metrics of Physical Non-invasive Security

Huiyun Li , Keke Wu , Fengqi Yu , Hai Yuan
4th IFIP WG 11.2 International Workshop on Information Security Theory and Practices: Security and Privacy of Pervasive Systems and Smart Devices (WISTP), Apr 2010, Passau, Germany. pp.60-75, ⟨10.1007/978-3-642-12368-9_5⟩
Conference papers hal-01056066v1
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Improved Fault Analysis of Signature Schemes

Christophe Giraud , Erik W. Knudsen , Michael Tunstall
9th IFIP WG 8.8/11.2 International Conference on Smart Card Research and Advanced Applications (CARDIS), Apr 2010, Passau, Germany. pp.164-181, ⟨10.1007/978-3-642-12510-2_12⟩
Conference papers hal-01056107v1