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2 results
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Testing Product Generation in Software Product Lines Using Pairwise for Features Coverage22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS), Nov 2010, Natal, Brazil. pp.111-125, ⟨10.1007/978-3-642-16573-3_9⟩
Conference papers
hal-01055240v1
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Efficient Entropy Estimation for Mutual Information Analysis Using B-Splines4th IFIP WG 11.2 International Workshop on Information Security Theory and Practices: Security and Privacy of Pervasive Systems and Smart Devices (WISTP), Apr 2010, Passau, Germany. pp.17-30, ⟨10.1007/978-3-642-12368-9_2⟩
Conference papers
hal-01056070v1
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