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Deposit type : Fulltext
labStructName_s : ATMEL Secure Microcontroller Solutions, Zone Industrielle
labStructName_s : Alarcos Research Group
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Testing Product Generation in Software Product Lines Using Pairwise for Features Coverage

Beatriz Pérez Lamancha , Macario Polo Usaola
22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS), Nov 2010, Natal, Brazil. pp.111-125, ⟨10.1007/978-3-642-16573-3_9⟩
Conference papers hal-01055240v1
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Efficient Entropy Estimation for Mutual Information Analysis Using B-Splines

Alexandre Venelli
4th IFIP WG 11.2 International Workshop on Information Security Theory and Practices: Security and Privacy of Pervasive Systems and Smart Devices (WISTP), Apr 2010, Passau, Germany. pp.17-30, ⟨10.1007/978-3-642-12368-9_2⟩
Conference papers hal-01056070v1