@inproceedings{perezlamancha:hal-01055240,
  TITLE = {{Testing Product Generation in Software Product                                    Lines Using Pairwise for Features Coverage}},
  AUTHOR = {P{\'e}rez Lamancha, Beatriz and Polo Usaola, Macario},
  URL = {https://inria.hal.science/hal-01055240},
  BOOKTITLE = {{22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS)}},
  ADDRESS = {Natal, Brazil},
  EDITOR = {Alexandre Petrenko; Adenilso Sim{\~a}o; Jos{\'e} Carlos                                    Maldonado},
  PUBLISHER = {{Springer}},
  SERIES = {Testing Software and Systems},
  VOLUME = {LNCS-6435},
  PAGES = {111-125},
  YEAR = {2010},
  MONTH = Nov,
  DOI = {10.1007/978-3-642-16573-3\_9},
  KEYWORDS = {testing ; software product lines ; combinatorial testing ; feature overage ; pairwise},
  PDF = {https://inria.hal.science/hal-01055240/file/64350110.pdf},
  HAL_ID = {hal-01055240},
  HAL_VERSION = {v1},
}