%0 Conference Proceedings
%T Testing Product Generation in Software Product Lines Using Pairwise for Features Coverage
%+ Software Testing Centre
%+ Alarcos Research Group
%A Pérez Lamancha, Beatriz
%A Polo Usaola, Macario
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS)
%C Natal, Brazil
%Y Alexandre Petrenko; Adenilso Simão; José Carlos Maldonado
%I Springer
%3 Testing Software and Systems
%V LNCS-6435
%P 111-125
%8 2010-11-08
%D 2010
%R 10.1007/978-3-642-16573-3_9
%K testing
%K software product lines
%K combinatorial testing
%K feature overage
%K pairwise
%Z Computer Science [cs]/Digital Libraries [cs.DL]Conference papers
%X A Software Product Lines (SPL) is "a set of software-intensive systems sharing a common, managed set of features that satisfy the specific needs of a particular market segment or mission and that are developed from a common set of core assets in a prescribed way". Variability is a central concept that permits the generation of different products of the family by reusing core assets. It is captured through features which, for a SPL, define its scope. Features are represented in a feature model, which is later used to generate the products from the line. From the testing point of view, testing all the possible combinations in feature models is not practical because: (1) the number of possible combinations (i.e., combinations of features for composing products) may be untreatable, and (2) some combinations may contain incompatible features. Thus, this paper resolves the problem by the implementation of combinatorial testing techniques adapted to the SPL context.
%G English
%2 https://inria.hal.science/hal-01055240/document
%2 https://inria.hal.science/hal-01055240/file/64350110.pdf
%L hal-01055240
%U https://inria.hal.science/hal-01055240
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-LNCS-6435
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-TC6
%~ IFIP-WG6-1
%~ IFIP-ICTSS
%~ IFIP-2010