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Multiple Mutation Testing from Finite State Machines with Symbolic Inputs29th IFIP International Conference on Testing Software and Systems (ICTSS), Oct 2017, St. Petersburg, Russia. pp.108-125, ⟨10.1007/978-3-319-67549-7_7⟩
Conference papers
hal-01678962v1
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Multiple Mutation Testing for Timed Finite State Machine with Timed Guards and Timeouts31th IFIP International Conference on Testing Software and Systems (ICTSS), Oct 2019, Paris, France
Conference papers
hal-02341856v1
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