%0 Conference Proceedings
%T Multiple Mutation Testing for Timed Finite State Machine with Timed Guards and Timeouts
%+ Computer Research Institute of Montréal (CRIM)
%+ University of Quebec at Montreal, Montreal, Quebec, Canada
%+ Laboratoire Bordelais de Recherche en Informatique (LaBRI)
%+ Institut Polytechnique de Bordeaux (Bordeaux INP)
%+ Université de Bordeaux (UB)
%+ Centre National de la Recherche Scientifique (CNRS)
%A Nguena Timo, Omer
%A Prestat, Dimitri
%A Rollet, Antoine
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 31th IFIP International Conference on Testing Software and Systems (ICTSS)
%C Paris, France
%Y Christophe Gaston
%Y Nikolai Kosmatov
%Y Pascale Le Gall
%I Springer International Publishing
%3 Testing Software and Systems
%V LNCS-11812
%8 2019-10-15
%D 2019
%Z Computer Science [cs]/Networking and Internet Architecture [cs.NI]
%Z Computer Science [cs]/Software Engineering [cs.SE]Conference papers
%X The problem of generating tests detecting all logical and timing faults which can occur in real-time systems is challenging; this is because the number of (timing) faults is potentially too big or infinite. As a result, it might be time consuming to generate an important number of adequate tests. The traditional model based testing approach considers a fault domain as the universe of all machines with a given number of states and input-output alphabet while mutation based approaches define a list of mutants to kill with a test suite. In this paper, we combine the two approaches by developing a mutation testing technique for real-time systems represented with deterministic timed finite state machines with timed guards and timeouts (TFSM-TG). In this approach, fault domains consisting of fault-seeded versions of the specification (mutants) are represented with non-deterministic TFSM-TG. The test generation avoids the one-by-one enumeration of the mutants and is based on constraint solving. We present the results of an empirical proof-of-concept implementation of the proposed approach.
%G English
%Z TC 6
%Z WG 6.1
%2 https://inria.hal.science/hal-02341856/document
%2 https://inria.hal.science/hal-02341856/file/paper29.pdf
%L hal-02341856
%U https://inria.hal.science/hal-02341856
%~ CNRS
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-TC6
%~ IFIP-WG6-1
%~ IFIP-ICTSS
%~ IFIP-LNCS-11812
%~ TEST-HALCNRS