@inproceedings{nguenatimo:hal-01678962,
  TITLE = {{Multiple Mutation Testing from Finite State Machines with Symbolic Inputs}},
  AUTHOR = {Nguena Timo, Omer and Petrenko, Alexandre and Ramesh, S.},
  URL = {https://inria.hal.science/hal-01678962},
  NOTE = {Part 2: Test Derivation Methods},
  BOOKTITLE = {{29th IFIP International Conference on Testing Software and Systems (ICTSS)}},
  ADDRESS = {St. Petersburg, Russia},
  EDITOR = {Nina Yevtushenko and Ana Rosa Cavalli and H{\"u}sn{\"u} Yenig{\"u}n},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Testing Software and Systems},
  VOLUME = {LNCS-10533},
  PAGES = {108-125},
  YEAR = {2017},
  MONTH = Oct,
  DOI = {10.1007/978-3-319-67549-7\_7},
  KEYWORDS = {Extended FSM ; Symbolic inputs ; Conformance testing ; Mutation testing fault modelling ; Fault model-based test generation ; Constraint solving},
  PDF = {https://inria.hal.science/hal-01678962/file/449632_1_En_7_Chapter.pdf},
  HAL_ID = {hal-01678962},
  HAL_VERSION = {v1},
}