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On the Efficiency of Early Bird Sampling (EBS) an Error Detection-Correction Scheme for Data-Driven Voltage Over-Scaling25th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2017, Abu Dhabi, United Arab Emirates. pp.153-177, ⟨10.1007/978-3-030-15663-3_8⟩
Conference papers
hal-02319786v1
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