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Treatment of Ventricular Assist Device Test Bench Data for Prediction of Failures and Improved Intrinsic Reliability10th Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), May 2019, Costa de Caparica, Portugal. pp.183-190, ⟨10.1007/978-3-030-17771-3_15⟩
Conference papers
hal-02295262v1
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