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authFullName_s : Jörg Pierer
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Plenoptic Inspection System for Automatic Quality Control of MEMS and Microsystems

Moritz A. Kirschmann , Jörg Pierer , Alexander Steinecker , Philipp Schmid , Arne Erdmann
9th International Precision Assembly Seminar (IPAS), Dec 2020, Held virtually, Unknown Region. pp.220-232, ⟨10.1007/978-3-030-72632-4_16⟩
Conference papers hal-03520396v1