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authFullName_s : Jie Tan
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Fault Diagnosis and Knowledge Extraction Using Fast Logical Analysis of Data with Multiple Rules Discovery Ability

 Xiwei Bai , Jie Tan , Xuelei Wang
2nd International Conference on Intelligence Science (ICIS), Nov 2018, Beijing, China. pp.412-421, ⟨10.1007/978-3-030-01313-4_44⟩
Conference papers hal-02118838v1
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