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hal_authIdPerson_i : 770343

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		A Critical Evaluation of RFID in Manufacturing Wei Zhou , Selwyn Piramuthu 19th Advances in Production Management Systems (APMS), Sep 2012, Rhodes, Greece. pp.41-48, ⟨10.1007/978-3-642-40361-3_6⟩ Conference papers hal-01470666v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More