Information-Rich Manufacturing Metrology
Abstract
Information-rich metrology (IRM) is a new term that refers to an approach, where the conventional paradigm of measurement is transcended, thanks to the introduction and active role of multiple novel sources of information. The overarching goal of IRM is to encompass and homogenise all those measurement scenarios where information available from heterogeneous sources, for example, from the object being measured, the manufacturing process that was used to fabricate it, the workings of the measurement instrument itself, as well as from any previous measurements carried with any other instrument, is gathered and somewhat incorporated with an active role into the measurement pipeline in order to ultimately achieve a higher-quality measurement result (better metrological performance, shorter measurement times, smaller consumption of resources). Examples of IRM in action in precision and additive manufacturing will be presented, including the measurement of form and texture.
Domains
Computer Science [cs]| Origin | Files produced by the author(s) |
|---|
Loading...
