%0 Conference Proceedings
%T Compressing Automatically Generated Unit Test Suites Through Test Parameterization
%+ Ferdowsi University of Mashhad (FUM)
%A Azamnouri, Aidin
%A Paydar, Samad
%Z Part 5: Testing
%< avec comité de lecture
%@ 978-3-030-89246-3
%( Lecture Notes in Computer Science
%B 9th International Conference on Fundamentals of Software Engineering (FSEN)
%C Virtual, Iran
%Y Hossein Hojjat
%Y Mieke Massink
%I Springer International Publishing
%3 Fundamentals of Software Engineering
%V LNCS-12818
%P 215-221
%8 2021-05-19
%D 2021
%R 10.1007/978-3-030-89247-0_15
%K Automated test generation;Maintainability;Readability;Unit test;Parameterized unit tests;Test suites;Randoop
%Z Computer Science [cs]Conference papers
%X Test maintenance has recently gained increasing attention from the software testing research community. When using automated unit test generation tools, the tests are typically created by random test generation or search-based algorithms. Although these tools produce a large number of tests quickly, they mostly seek to improve test coverage; overlooking other quality attributes like understandability and readability. As a result, maintaining a large and automatically generated test suite is quite challenging. In this paper, by utilizing a high level of similarity among the automatically generated tests, we propose a technique for automatically abstracting similar tests through transforming them into parameterized tests. This approach leads to the improvement of readability and understandability by reducing the size of the test suite and also by separating data and logic of the tests. We have implemented this technique as a plugin for IntelliJ IDEA and have evaluated its performance over the test suites produced by the Randoop test generation tool. The results have demonstrated that the proposed approach is able to effectively reduce the size of the test suites between 11% and 96%, with an average of 66%.
%G English
%Z TC 2
%Z WG 2.2
%2 https://inria.hal.science/hal-04074527/document
%2 https://inria.hal.science/hal-04074527/file/506725_1_En_15_Chapter.pdf
%L hal-04074527
%U https://inria.hal.science/hal-04074527
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-TC
%~ IFIP-TC2
%~ IFIP-WG2-2
%~ IFIP-FSEN
%~ IFIP-LNCS-12818