@inproceedings{reis:hal-03217374,
  TITLE = {{Strategies for Reducing Power Consumption and Increasing Reliability in IoT}},
  AUTHOR = {Reis, Ricardo},
  URL = {https://inria.hal.science/hal-03217374},
  NOTE = {Part 3: IFIPIoT 2018 Refereed Papers},
  BOOKTITLE = {{1st IFIP International Internet of Things Conference (IFIPIoT)}},
  ADDRESS = {Poznan, Poland},
  EDITOR = {Leon Strous and Vinton G. Cerf},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Internet of Things. Information Processing in an Increasingly Connected World},
  VOLUME = {AICT-548},
  PAGES = {76-88},
  YEAR = {2018},
  MONTH = Sep,
  DOI = {10.1007/978-3-030-15651-0\_8},
  KEYWORDS = {Nanoelectronics ; Internet-of-Things ; Optimization ; Physical design ; Fault tolerance ; Radiation effects},
  PDF = {https://inria.hal.science/hal-03217374/file/481032_1_En_8_Chapter.pdf},
  HAL_ID = {hal-03217374},
  HAL_VERSION = {v1},
}