@inproceedings{ameri:hal-02419266,
  TITLE = {{A Thesaurus-Guided Method for Smart Manufacturing Diagnostics}},
  AUTHOR = {Ameri, Farhad and Yoder, Reid},
  URL = {https://inria.hal.science/hal-02419266},
  NOTE = {Part 11: Intelligent Diagnostics and Maintenance Solutions for Smart Manufacturing},
  BOOKTITLE = {{IFIP International Conference on Advances in Production Management Systems (APMS)}},
  ADDRESS = {Austin, TX, United States},
  EDITOR = {Farhad Ameri and Kathryn E. Stecke and Gregor von Cieminski and Dimitris Kiritsis},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Advances in Production Management Systems. Production Management for the Factory of the Future},
  VOLUME = {AICT-566},
  NUMBER = {Part I},
  PAGES = {722-729},
  YEAR = {2019},
  MONTH = Sep,
  DOI = {10.1007/978-3-030-30000-5\_88},
  KEYWORDS = {Smart maintenance ; Knowledge graph ; Thesaurus ; Natural Language Processing},
  PDF = {https://inria.hal.science/hal-02419266/file/489100_1_En_88_Chapter.pdf},
  HAL_ID = {hal-02419266},
  HAL_VERSION = {v1},
}