%0 Conference Proceedings
%T TRIZ – Develop or Die in a World Driven by Volatility, Uncertainty, Complexity and Ambiguity
%+ Corporate technology Siemens
%+ Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg (FAU)
%A Kiesel, Martin
%A Hammer, Jens
%Z Part 3: Managing with TRIZ
%< avec comité de lecture
%( IFIP Advances in Information and Communication Technology
%B 18th TRIZ Future Conference (TFC)
%C Strasbourg, France
%Y Denis Cavallucci
%Y Roland De Guio
%Y Sebastian Koziołek
%I Springer International Publishing
%3 Automated Invention for Smart Industries
%V AICT-541
%P 55-65
%8 2018-10-29
%D 2018
%R 10.1007/978-3-030-02456-7_5
%K TRIZ
%K VUCA
%K Cynefin Framework
%K Three-Layered product architecture
%Z Computer Science [cs]Conference papers
%X Across industries, companies face the need to increase development speed in a volatile and uncertain market environment, and digitalization, cloud computing, and artificial intelligence are game-changing. Classical theory of inventive problem-solving (TRIZ) is derived from patent analysis and based on technical/mechanical problem-solving. Many TRIZ methods and tools exist to address the changing and difficult-to-predict marketplace. However, in a VUCA (volatility, uncertainty, complexity, and ambiguity) world, we face situations that are increasingly complex and potentially require different approaches. This paper discusses the extent to which TRIZ methods and tools are helpful in a “VUCA world” and how TRIZ should be adapted in this changing environment. The authors investigate when TRIZ can provide helpful direction and in which dimensions it should evolve. A potential “TRIZ Picture of the Future” is presented based on a literature review and long-term experience in Lean development, TRIZ, and foresight technologies.
%G English
%Z TC 5
%2 https://inria.hal.science/hal-02279774/document
%2 https://inria.hal.science/hal-02279774/file/474537_1_En_5_Chapter.pdf
%L hal-02279774
%U https://inria.hal.science/hal-02279774
%~ IFIP
%~ IFIP-AICT
%~ IFIP-TC
%~ IFIP-TC5
%~ IFIP-AICT-541
%~ IFIP-TFC