@inproceedings{yang:hal-02118800,
  TITLE = {{UAV Assisted Bridge Defect Inspection System}},
  AUTHOR = {Yang, Shuzhan and Shen, Zhen and Wang, Xiao and Bai, Tianxiang and Ji, Yingliang and Jiang, Yuyi and Liu, Xiwei and Dong, Xisong and Li, Chuanfu and Han, Qi and Lu, Jian and Xiong, Gang},
  URL = {https://inria.hal.science/hal-02118800},
  NOTE = {Part 7: Fault Diagnosis},
  BOOKTITLE = {{2nd International Conference on Intelligence Science (ICIS)}},
  ADDRESS = {Beijing, China},
  EDITOR = {Zhongzhi Shi and Cyriel Pennartz and Tiejun Huang},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Intelligence Science II},
  VOLUME = {AICT-539},
  PAGES = {401-411},
  YEAR = {2018},
  MONTH = Nov,
  DOI = {10.1007/978-3-030-01313-4\_43},
  KEYWORDS = {UAV ; Defect inspection ; Electromechanics system ; Communication system ; Image processing},
  PDF = {https://inria.hal.science/hal-02118800/file/474230_1_En_43_Chapter.pdf},
  HAL_ID = {hal-02118800},
  HAL_VERSION = {v1},
}