%0 Conference Proceedings
%T Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors
%+ University of Tehran
%+ University of Southern California (USC)
%A Hemmat, Maedeh
%A Kamal, Mehdi
%A Afzali-Kusha, Ali
%A Pedram, Massoud
%< avec comité de lecture
%( IFIP Advances in Information and Communication Technology
%B 24th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSISOC)
%C Tallinn, Estonia
%Y Thomas Hollstein
%Y Jaan Raik
%Y Sergei Kostin
%Y Anton Tšertov
%Y Ian O'Connor
%Y Ricardo Reis
%I Springer International Publishing
%3 VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability
%V AICT-508
%P 41-59
%8 2016-09-26
%D 2016
%R 10.1007/978-3-319-67104-8_3
%K Tunnel FET
%K Reliability issues
%K Process variation
%K Low power design
%K Hybrid TFET-MOSFET designs
%K Soft error
%Z Computer Science [cs]Conference papers
%X In this work, to improve the timing yield of Tunnel Field Effect Transistor (TFET) circuits in the presence of process variations as well as their soft-error resiliency, we propose replacing some of TFET-based gates by MOSFET-based ones. The effectiveness of the proposed TFET-MOSFET hybrid implementation of the circuits are investigated by first studying the impacts of the process variation on the performances (I-V characteristics) of both homojunction InAs TFETs and MOSFETs. Next, to analyze the soft error rate of the circuits, the particle hit-induced transient current profiles of these devices are extracted. Based on these studies, a hybrid TFET-MOSFET circuit design approach which improves the reliability and soft-error resiliency compared to those of pure TFET-based circuits is suggested. Finally, the efficacy of the design approach is investigated by applying it to some circuits of ISCAS’89 benchmark package.
%G English
%Z TC 10
%Z WG 10.5
%2 https://inria.hal.science/hal-01675198/document
%2 https://inria.hal.science/hal-01675198/file/456609_1_En_3_Chapter.pdf
%L hal-01675198
%U https://inria.hal.science/hal-01675198
%~ IFIP
%~ IFIP-AICT
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-VLSISOC
%~ IFIP-TC10
%~ IFIP-WG10-5
%~ IFIP-AICT-508