@inproceedings{mrozek:hal-01656229,
  TITLE = {{Optimal Controlled Random Tests}},
  AUTHOR = {Mrozek, Ireneusz and Yarmolik, Vyacheslav},
  URL = {https://inria.hal.science/hal-01656229},
  NOTE = {Part 1: Algorithms},
  BOOKTITLE = {{16th IFIP International Conference on Computer Information Systems and Industrial Management (CISIM)}},
  ADDRESS = {Bialystok, Poland},
  EDITOR = {Khalid Saeed and Wladyslaw Homenda and Rituparna Chaki},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Computer Information Systems and Industrial Management},
  VOLUME = {LNCS-10244},
  PAGES = {27-38},
  YEAR = {2017},
  MONTH = Jun,
  DOI = {10.1007/978-3-319-59105-6\_3},
  KEYWORDS = {Random tests ; Controlled tests ; Multi-run tests ; Hemming distance ; Euclidean distance ; Pattern sensitive faults ; RAM},
  PDF = {https://inria.hal.science/hal-01656229/file/448933_1_En_3_Chapter.pdf},
  HAL_ID = {hal-01656229},
  HAL_VERSION = {v1},
}