@inproceedings{cui:hal-01647990,
  TITLE = {{Exploiting Cross-Layer Hotness Identification to Improve Flash Memory System Performance}},
  AUTHOR = {Cui, Jinhua and Wu, Weiguo and Nie, Shiqiang and Huang, Jianhang and Hu, Zhuang and Zou, Nianjun and Wang, Yinfeng},
  URL = {https://inria.hal.science/hal-01647990},
  NOTE = {Part 1: Memory: Non-Volatile, Solid State Drives, Hybrid Systems},
  BOOKTITLE = {{13th IFIP International Conference on Network and Parallel Computing (NPC)}},
  ADDRESS = {Xi'an, China},
  EDITOR = {Guang R. Gao and Depei Qian and Xinbo Gao and Barbara Chapman and Wenguang Chen},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Network and Parallel Computing},
  VOLUME = {LNCS-9966},
  PAGES = {17-28},
  YEAR = {2016},
  MONTH = Oct,
  DOI = {10.1007/978-3-319-47099-3\_2},
  KEYWORDS = {NAND flash memory ; Endurance ; Raw bit error rate ; Threshold voltage ; Cross-layer},
  PDF = {https://inria.hal.science/hal-01647990/file/432484_1_En_2_Chapter.pdf},
  HAL_ID = {hal-01647990},
  HAL_VERSION = {v1},
}