@inproceedings{petrenko:hal-01643724,
  TITLE = {{Test Generation by Constraint Solving and FSM Mutant Killing}},
  AUTHOR = {Petrenko, Alexandre and Timo, Omer Nguena and Ramesh, S.},
  URL = {https://inria.hal.science/hal-01643724},
  NOTE = {Part 1: Testing Methodologies},
  BOOKTITLE = {{28th IFIP International Conference on Testing Software and Systems (ICTSS)}},
  ADDRESS = {Graz, Austria},
  EDITOR = {Franz Wotawa and Mihai Nica and Natalia Kushik},
  PUBLISHER = {{Springer International Publishing}},
  SERIES = {Testing Software and Systems},
  VOLUME = {LNCS-9976},
  PAGES = {36-51},
  YEAR = {2016},
  MONTH = Oct,
  DOI = {10.1007/978-3-319-47443-4\_3},
  KEYWORDS = {FSM ; Conformance testing ; Mutation testing ; Fault modelling ; Fault model-based test generation ; Test coverage ; Fault coverage analysis},
  PDF = {https://inria.hal.science/hal-01643724/file/419911_1_En_3_Chapter.pdf},
  HAL_ID = {hal-01643724},
  HAL_VERSION = {v1},
}