@inproceedings{ubar:hal-01578613,
  TITLE = {{Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs}},
  AUTHOR = {Ubar, Raimund and J{\"u}rim{\"a}gi, Lembit and Orasson, Elmet and Raik, Jaan},
  URL = {https://inria.hal.science/hal-01578613},
  BOOKTITLE = {{23th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC)}},
  ADDRESS = {Daejeon, South Korea},
  SERIES = {VLSI-SoC: Design for Reliability, Security, and Low Power},
  VOLUME = {AICT-483},
  PAGES = {23-45},
  YEAR = {2015},
  MONTH = Oct,
  DOI = {10.1007/978-3-319-46097-0\_2},
  KEYWORDS = {Combinational circuits ; Fault collapsing ; Fault equivalence and dominance ; Binary decision diagrams ; Lower and higher bounds},
  PDF = {https://inria.hal.science/hal-01578613/file/431455_1_En_2_Chapter.pdf},
  HAL_ID = {hal-01578613},
  HAL_VERSION = {v1},
}