%0 Conference Proceedings
%T Object-Oriented Testing Capabilities and Performance Evaluation of the C# Mutation System
%+ Institute of Computer Science
%A Derezińska, Anna
%A Szustek, Anna
%Z Part 3: Measurements, Testing, and Quality of Software
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 4th Central and East European Conference on Software Engineering Techniques (CEESET)
%C Krakow, Poland
%Y David Hutchison
%Y Takeo Kanade
%Y Madhu Sudan
%Y Demetri Terzopoulos
%Y Doug Tygar
%Y Moshe Y. Vardi
%Y Gerhard Weikum
%Y Tomasz Szmuc
%Y Marcin Szpyrka
%Y Jaroslav Zendulka
%Y Josef Kittler
%Y Jon M. Kleinberg
%Y Friedemann Mattern
%Y John C. Mitchell
%Y Moni Naor
%Y Oscar Nierstrasz
%Y C. Pandu Rangan
%Y Bernhard Steffen
%I Springer
%3 Advances in Software Engineering Techniques
%V LNCS-7054
%P 229-242
%8 2009-10-12
%D 2009
%R 10.1007/978-3-642-28038-2_18
%K mutation testing
%K object-oriented mutation operators
%K C#
%K system evolution
%Z Computer Science [cs]Conference papers
%X The main purpose of mutation testing approach is to check a test suite quality in terms of the adequacy to killing programs with inserted programming faults. We present advances in the C# mutation testing system that supports object-oriented mutation operators. The system enhancements related to functional requirements (mutation operators, avoiding generation of invalid and partially of equivalent mutants) and non-functional ones (speed-up using a new parser and reflection, space reduction storing mutant updates). Mutation testing of six widely used open source programs is discussed. The quality of the tests supplied with these programs was experimentally determined. Performance measures were evaluated to assess system enhancements (2-4 faster mutants creation, 10-100 times disk space reduction, tradeoff of time overhead for storing mutants of different size in a local or remote repository).
%G English
%Z TC 2
%2 https://inria.hal.science/hal-01527392/document
%2 https://inria.hal.science/hal-01527392/file/978-3-642-28038-2_18_Chapter.pdf
%L hal-01527392
%U https://inria.hal.science/hal-01527392
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-TC
%~ IFIP-TC2
%~ IFIP-LNCS-7054
%~ IFIP-CEESET