@inproceedings{yang:hal-01482426,
  TITLE = {{Querying Parametric Temporal Logic Properties on Embedded Systems}},
  AUTHOR = {Yang, Hengyi and Hoxha, Bardh and Fainekos, Georgios},
  URL = {https://inria.hal.science/hal-01482426},
  NOTE = {Part 4: Testing of Embedded Systems},
  BOOKTITLE = {{24th International Conference on Testing Software and Systems (ICTSS)}},
  ADDRESS = {Aalborg, Denmark},
  EDITOR = {Brian Nielsen and Carsten Weise},
  PUBLISHER = {{Springer}},
  SERIES = {Testing Software and Systems},
  VOLUME = {LNCS-7641},
  PAGES = {136-151},
  YEAR = {2012},
  MONTH = Nov,
  DOI = {10.1007/978-3-642-34691-0\_11},
  PDF = {https://inria.hal.science/hal-01482426/file/978-3-642-34691-0_11_Chapter.pdf},
  HAL_ID = {hal-01482426},
  HAL_VERSION = {v1},
}