%0 Conference Proceedings
%T A Technique for Agile and Automatic Interaction Testing for Product Lines
%+ Information and Communication Technology [Oslo] (SINTEF - ICT)
%+ University of Oslo (UiO)
%+ ABB
%A Johansen, Martin, Fagereng
%A Haugen, Øystein
%A Fleurey, Franck
%A Carlson, Erik
%A Endresen, Jan
%A Wien, Tormod
%Z Part 2: Testing in Practice
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 24th International Conference on Testing Software and Systems (ICTSS)
%C Aalborg, Denmark
%Y Brian Nielsen
%Y Carsten Weise
%I Springer
%3 Testing Software and Systems
%V LNCS-7641
%P 39-54
%8 2012-11-19
%D 2012
%R 10.1007/978-3-642-34691-0_5
%K Product Lines
%K Testing
%K Agile
%K Continuous Integration
%K Automatic
%K Combinatorial Interaction Testing
%Z Computer Science [cs]
%Z Computer Science [cs]/Networking and Internet Architecture [cs.NI]Conference papers
%X Product line developers must ensure that existing and new features work in all products. Adding to or changing a product line might break some of its features. In this paper, we present a technique for automatic and agile interaction testing for product lines. The technique enables developers to know if features work together with other features in a product line, and it blends well into a process of continuous integration. The technique is evaluated with two industrial applications, testing a product line of safety devices and the Eclipse IDEs. The first case shows how existing test suites are applied to the products of a 2-wise covering array to identify two interaction faults. The second case shows how over 400,000 test executions are performed on the products of a 2-wise covering array using over 40,000 existing automatic tests to identify potential interactions faults.
%G English
%Z TC 6
%Z WG 6.1
%2 https://inria.hal.science/hal-01482410/document
%2 https://inria.hal.science/hal-01482410/file/978-3-642-34691-0_5_Chapter.pdf
%L hal-01482410
%U https://inria.hal.science/hal-01482410
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-TC6
%~ IFIP-WG6-1
%~ IFIP-ICTSS
%~ IFIP-LNCS-7641