@inproceedings{strug:hal-01482402,
  TITLE = {{Machine Learning Approach in Mutation Testing}},
  AUTHOR = {Strug, Joanna and Strug, Barbara},
  URL = {https://inria.hal.science/hal-01482402},
  NOTE = {Part 6: New Testing Methods},
  BOOKTITLE = {{24th International Conference on Testing Software and Systems (ICTSS)}},
  ADDRESS = {Aalborg, Denmark},
  EDITOR = {Brian Nielsen and Carsten Weise},
  PUBLISHER = {{Springer}},
  SERIES = {Testing Software and Systems},
  VOLUME = {LNCS-7641},
  PAGES = {200-214},
  YEAR = {2012},
  MONTH = Nov,
  DOI = {10.1007/978-3-642-34691-0\_15},
  KEYWORDS = {mutation testing ; machine learning ; graph distance ; classification ; test evaluation},
  PDF = {https://inria.hal.science/hal-01482402/file/978-3-642-34691-0_15_Chapter.pdf},
  HAL_ID = {hal-01482402},
  HAL_VERSION = {v1},
}