@inproceedings{parizi:hal-01466693,
  TITLE = {{Compiler Optimizations Do Impact the Reliability of Control-Flow Radiation Hardened Embedded Software}},
  AUTHOR = {Parizi, Rafael B. and Ferreira, Ronaldo R. and Carro, Luigi and Moreira, {\'A}lvaro F.},
  URL = {https://inria.hal.science/hal-01466693},
  NOTE = {Part 2: Non-functional Aspects of Embedded Systems},
  BOOKTITLE = {{4th International Embedded Systems Symposium (IESS)}},
  ADDRESS = {Paderborn, Germany},
  EDITOR = {Gunar Schirner and Marcelo G{\"o}tz and Achim Rettberg and Mauro C. Zanella and Franz J. Rammig},
  PUBLISHER = {{Springer}},
  SERIES = {Embedded Systems: Design, Analysis and Verification},
  VOLUME = {AICT-403},
  PAGES = {49-60},
  YEAR = {2013},
  MONTH = Jun,
  DOI = {10.1007/978-3-642-38853-8\_5},
  KEYWORDS = {compiler optimization ; compiler orchestration ; embedded systems ; fault tolerance ; LLVM ; radiation ; reliability ; soft errors ; tuning},
  PDF = {https://inria.hal.science/hal-01466693/file/978-3-642-38853-8_5_Chapter.pdf},
  HAL_ID = {hal-01466693},
  HAL_VERSION = {v1},
}