@inproceedings{petrenko:hal-01432920,
  TITLE = {{Multiple Mutation Testing from FSM}},
  AUTHOR = {Petrenko, Alexandre and Nguena Timo, Omer and Ramesh, S.},
  URL = {https://inria.hal.science/hal-01432920},
  BOOKTITLE = {{36th International Conference on Formal Techniques for Distributed Objects, Components, and Systems (FORTE)}},
  ADDRESS = {Heraklion, Greece},
  EDITOR = {Elvira Albert and Ivan Lanese},
  SERIES = {Formal Techniques for Distributed Objects, Components, and Systems},
  VOLUME = {LNCS-9688},
  PAGES = {222-238},
  YEAR = {2016},
  MONTH = Jun,
  DOI = {10.1007/978-3-319-39570-8\_15},
  KEYWORDS = {FSM ; Conformance testing ; Mutation testing ; Fault modelling ; Fault model-based test generation ; Test coverage ; Fault coverage analysis},
  PDF = {https://inria.hal.science/hal-01432920/file/426757_1_En_15_Chapter.pdf},
  HAL_ID = {hal-01432920},
  HAL_VERSION = {v1},
}