@inproceedings{beroulle:hal-01383737,
  TITLE = {{Laser-Induced Fault Effects in Security-Dedicated Circuits}},
  AUTHOR = {Beroulle, Vincent and Candelier, Philippe and de Castro, Stephan and Di Natale, Giorgio and Dutertre, Jean-Max and Flottes, Marie-Lise and Hely, David and Hubert, Guillaume and Leveugle, R{\'e}gis and Lu, Feng and Maistri, Paolo and Papadimitriou, Athanasios and Rouzeyre, Bruno and Tavernier, Clement and Vanhauwaert, Pierre},
  URL = {https://inria.hal.science/hal-01383737},
  BOOKTITLE = {{VLSI-SoC: Very Large Scale Integration and System-on-Chip}},
  ADDRESS = {Playa del Carmen, Mexico},
  EDITOR = {Luc Claesen and Maria-Teresa Sanz-Pascual and Ricardo Reis and Arturo Sarmiento-Reyes},
  SERIES = {IFIP Advances in Information and Communication Technology},
  VOLUME = {AICT-464},
  PAGES = {220-240},
  YEAR = {2014},
  MONTH = Oct,
  DOI = {10.1007/978-3-319-25279-7\_12},
  KEYWORDS = {Lasers ; Security evaluation ; Counter-measures ; Fault attacks ; Fault models ; Hardware security},
  PDF = {https://inria.hal.science/hal-01383737/file/371768_1_En_12_Chapter.pdf},
  HAL_ID = {hal-01383737},
  HAL_VERSION = {v1},
}