%0 Conference Proceedings
%T Debugging Methods Through Identification of Appropriate Functions for Internal Gates
%+ The University of Tokyo (UTokyo)
%+ Ishikawa National College of Technology
%A Oshima, Kosuke
%A Matsumoto, Takeshi
%A Fujita, Masahiro
%< avec comité de lecture
%( IFIP Advances in Information and Communication Technology
%B 21th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC)
%C Istanbul, Turkey
%Y Alex Orailoglu
%Y H. Fatih Ugurdag
%Y Luís Miguel Silveira
%Y Martin Margala
%Y Ricardo Reis
%3 VLSI-SoC: At the Crossroads of Emerging Trends
%V AICT-461
%P 1-22
%8 2013-10-06
%D 2013
%R 10.1007/978-3-319-23799-2_1
%K Gate-level circuit
%K Design debugging
%K Programmable circuit
%Z Computer Science [cs]Conference papers
%X In this chapter, we propose methods for correcting gate-level designs by identifying appropriate logic functions for internal gates. We introduce programmable circuits, such as look up table (LUT) and multiplexer (MUX) to the circuits under debugging, in order to formulate the correction processes mathematically. There are two steps in the proposed methods. The first one is to identify sets of gates and their appropriate inputs whose functions are to be modified. The second one is to actually identify logic functions for the correction by solving QBF (Quantified Boolean Formula) problems with repeated application of SAT solvers. There are a number of bugs which cannot be corrected unless the inputs of the gates to be modified are changed from the original ones, and the selection of such additional inputs is a key for effective debugging. We show a couple of methods by which appropriate inputs to the gates can be efficiently identified. Experimental results for each such a method as well as their combinations targeting benchmark circuits as well as industrial ones are shown.
%G English
%Z TC 10
%Z WG 10.5
%2 https://inria.hal.science/hal-01380296/document
%2 https://inria.hal.science/hal-01380296/file/367527_1_En_1_Chapter.pdf
%L hal-01380296
%U https://inria.hal.science/hal-01380296
%~ IFIP
%~ IFIP-AICT
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-HINC
%~ IFIP-AICT-461
%~ IFIP-TC10
%~ IFIP-WG10-5