@inproceedings{zikopoulos:hal-01055860,
  TITLE = {{The Value of Sampling Inspection in a Single-Period Remanufacturing System with Stochastic Returns Yield}},
  AUTHOR = {Zikopoulos, Christos and Panagiotidou, Sofia and Nenes, George},
  URL = {https://inria.hal.science/hal-01055860},
  BOOKTITLE = {{International Conference on Advances in Production and Management Systems (APMS)}},
  ADDRESS = {Paris, France},
  EDITOR = {Bruno Vallespir; Th{\`e}cle Alix},
  PUBLISHER = {{Springer}},
  SERIES = {Advances in Production Management Systems. New Challenges, New Approaches},
  VOLUME = {AICT-338},
  PAGES = {128-135},
  YEAR = {2009},
  MONTH = Sep,
  DOI = {10.1007/978-3-642-16358-6\_17},
  KEYWORDS = {reverse supply chain ; random yield ; sampling inspection ; binomial yield ; value of information},
  PDF = {https://inria.hal.science/hal-01055860/file/03380127.pdf},
  HAL_ID = {hal-01055860},
  HAL_VERSION = {v1},
}