%0 Conference Proceedings
%T Black-Box System Testing of Real-Time Embedded Systems Using Random and Search-based Testing
%+ Simula Research Laboratory [Lysaker] (SRL)
%+ Department of Informatics [Oslo]
%A Arcuri, Andrea
%A Iqbal, Muhammad Zohaib
%A Briand, Lionel
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS)
%C Natal, Brazil
%Y Alexandre Petrenko; Adenilso Simão; José Carlos Maldonado
%I Springer
%3 Testing Software and Systems
%V LNCS-6435
%P 95-110
%8 2010-11-08
%D 2010
%R 10.1007/978-3-642-16573-3_8
%K Search based software engineering
%K branch distance
%K model based testing
%K environment
%K context
%K UML
%K MARTE
%K OCL
%Z Computer Science [cs]/Digital Libraries [cs.DL]Conference papers
%X Testing real-time embedded systems (RTES) is in many ways challenging. Thousands of test cases can be potentially executed on an industrial RTES. Given the magnitude of testing at the system level, only a fully automated approach can really scale up to test industrial RTES. In this paper we take a black-box approach and model the RTES environment using the UML/MARTE international standard. Our main motivation is to provide a more practical approach to the model-based testing of RTES by allowing system testers, who are often not familiar with the system design but know the application domain well-enough, to model the environment to enable test automation. Environment models can support the automation of three tasks: the code generation of an environment simulator, the selection of test cases, and the evaluation of their expected results (oracles). In this paper, we focus on the second task (test case selection) and investigate three test automation strategies using inputs from UML/MARTE environment models: Random Testing (baseline), Adaptive Random Testing, and Search-Based Testing (using Genetic Algorithms). Based on one industrial case study and three artificial systems, we show how, in general, no technique is better than the others. Which test selection technique to use is determined by the failure rate (testing stage) and the execution time of test cases. Finally, we propose a practical process to combine the use of all three test strategies.
%G English
%2 https://inria.hal.science/hal-01055241/document
%2 https://inria.hal.science/hal-01055241/file/64350094.pdf
%L hal-01055241
%U https://inria.hal.science/hal-01055241
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-LNCS-6435
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-TC6
%~ IFIP-WG6-1
%~ IFIP-ICTSS
%~ IFIP-2010