%0 Conference Proceedings
%T An Approach to Derive Usage Models Variants for Model-Based Testing
%+ ALL4TEC RD [Laval]
%+ Université de Rennes (UR)
%+ Airbus Defence and Space [Taufkirchen]
%+ Institut de Recherche en Informatique et Systèmes Aléatoires (IRISA)
%A Samih, Hamza
%A Le Guen, Hélène
%A Bogusch, Ralf
%A Acher, Mathieu
%A Baudry, Benoit
%Z Part 2: Tools and Frameworks
%< avec comité de lecture
%( Lecture Notes in Computer Science
%B 26th IFIP International Conference on Testing Software and Systems (ICTSS)
%C Madrid, Spain
%Y Mercedes G. Merayo
%Y Edgardo Montes Oca
%I Springer
%3 Testing Software and Systems
%V LNCS-8763
%P 80-96
%8 2014-09-23
%D 2014
%R 10.1007/978-3-662-44857-1_6
%K Product Line
%K Model-based Testing
%K Usage Model
%K Usage Model Variant
%K Orthogonal Variability Model
%K Requirements
%Z Computer Science [cs]
%Z Computer Science [cs]/Networking and Internet Architecture [cs.NI]Conference papers
%X Testing techniques in industry are not yet adapted for product line engineering (PLE). In particular, Model-based Testing (MBT), a technique that allows to automatically generate test cases from requirements, lacks support for managing variability (differences) among a set of related product. In this paper, we present an approach to equip usage models, a widely used formalism in MBT, with variability capabilities. Formal correspondences are established between a variability model, a set of functional requirements, and a usage model. An algorithm then exploits the traceability links to automatically derive a usage model variant from a desired set of selected features. The approach is integrated into the professional MBT tool MaTeLo and is currently used in industry.
%G English
%Z TC 6
%Z WG 6.1
%2 https://inria.hal.science/hal-01025124v2/document
%2 https://inria.hal.science/hal-01025124v2/file/978-3-662-44857-1_6_Chapter.pdf
%L hal-01025124
%U https://inria.hal.science/hal-01025124
%~ INSTITUT-TELECOM
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%~ INSA-RENNES
%~ IRISA
%~ IRISA_SET
%~ IFIP-LNCS
%~ IFIP
%~ IFIP-TC
%~ IFIP-WG
%~ IFIP-TC6
%~ IFIP-WG6-1
%~ UR1-HAL
%~ IFIP-LNCS-8763
%~ UR1-MATH-STIC
%~ IFIP-ICTSS
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%~ TEST-UR-CSS
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%~ INSA-GROUPE
%~ INSTITUTS-TELECOM
%~ UR1-MATH-NUM