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		Testing Product Generation in Software Product Lines Using Pairwise for Features Coverage Beatriz Pérez Lamancha , Macario Polo Usaola 22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS), Nov 2010, Natal, Brazil. pp.111-125, ⟨10.1007/978-3-642-16573-3_9⟩ Conference papers hal-01055240v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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