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		Automated Vulnerability Detection in Embedded Devices Danjun Liu , Yong Tang , Baosheng Wang , Wei Xie , Bo Yu 14th IFIP International Conference on Digital Forensics (DigitalForensics), Jan 2018, New Delhi, India. pp.313-329, ⟨10.1007/978-3-319-99277-8_17⟩ Conference papers hal-01988845v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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