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		Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays Struan Gray , Stefan Axelsson 15th IFIP International Conference on Digital Forensics (DigitalForensics), Jan 2019, Orlando, FL, United States. pp.219-237, ⟨10.1007/978-3-030-28752-8_12⟩ Conference papers hal-02534609v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More