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		Design of Prioritized N-Wise Testing Eun-Hye Choi , Takashi Kitamura , Cyrille Artho , Yutaka Oiwa 26th IFIP International Conference on Testing Software and Systems (ICTSS), Sep 2014, Madrid, Spain. pp.186-191, ⟨10.1007/978-3-662-44857-1_14⟩ Conference papers hal-01405286v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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