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Fabric Defect Detection Using YOLOv2 and YOLO v3 Tiny

R. Sujee , D. Shanthosh , L. Sudharsun
3rd International Conference on Computational Intelligence in Data Science (ICCIDS), Feb 2020, Chennai, India. pp.196-204, ⟨10.1007/978-3-030-63467-4_15⟩
Conference papers hal-03434800v1