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		A Negative Input Space Complexity Metric as Selection Criterion for Fuzz Testing Martin A. Schneider , Marc-Florian Wendland , Andreas Hoffmann 27th IFIP International Conference on Testing Software and Systems (ICTSS), Nov 2015, Sharjah and Dubai, United Arab Emirates. pp.257-262, ⟨10.1007/978-3-319-25945-1_17⟩ Conference papers hal-01470152v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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