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		Reducing the Cost of Grammar-Based Testing Using Pattern Coverage Cleverton Hentz , Jurgen J. Vinju , Anamaria M. Moreira ICTSS 2015 - 27th IFIP International Conference on Testing Software and Systems, Nov 2015, Dubai, United Arab Emirates. pp.71-85, ⟨10.1007/978-3-319-25945-1_5⟩ Conference papers hal-01470158v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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