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		Using Model Learning for the Generation of Mock Components Sébastien Salva , Elliott Blot Testing Software and Systems - 32nd IFIP WG 6.1 International Conference, ICTSS 2020, Naples, Italy, December 9-11, 2020, Proceedings, pp.3-19, 2020, ⟨10.1007/978-3-030-64881-7_1⟩ Book sections hal-03048336v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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